PCN20027: Maximum Read Frequency on Certain LSRAM Read Modes Has Been Reduced
Description ■The following LSRAM configurations have derated FMAX specifications. Reason for Change ■On-going QA testing and verification exposed a timing criticality in a critical path within the LSRAM.
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PCN20025: Migration of Solder Paste for Package Decoupling Capacitors from RoHS to Sn/Pb for PolarFi
Description ■The solder paste used for package decoupling capacitors will migrate from a RoHS-compliant solder paste to an Sn/Pb 63/37 solder paste. Reason for Change ■To mitigate against tin whisker growth.
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PCN21002: Implement Microchip Label and Packing Changes for Microsemi FPGA and MSA (HiRel) Products
Reason for Change ■Streamlining internal processing by standardizing the packing method as part of the integration of Microsemi to Microchip processes. Products Affected by Change ■See document with list
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PCN20029: Addition of MMT as a Package Assembly Site for Legacy FPGAs with Gold (Au) Wires
Description ■Microchip FPGA Business Unit is adding Microchip Technology Thailand MMT as an assembly and packaging site for Legacy RT and commercial FPGAs with gold bond wires. The impact is on the following
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PCN20008: Conversion to Cu Wire for SmartFusion, IGLOO2, and SmartFusion2
Description ■Microsemi SoC group is currently performing qualification runs to convert SmartFusion in FG/FGG256 and IGL002/SmartFusion2 devices in TQ/TQG144 from Au wire to Gold Coated Palladium Copper
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