The wafer test program will change for defect pixel detection, having a new threshold for Dark Images at Long Exposure (integration time of 696 μs).The remaining defect pixels tests have the same integration time of 101 μs (Short Exposure).Please note that all these tests are performed with same testing criteria,for a maximum sensor temperature of 85 ºC and ADC gain registers defined with following values: AGL1Reg = 101d and AGL2Reg = 111d.

Brand of Product：	ams AG
Part#：	508030006 、 507830006 、 508080005 、 508070005 More Part#
Product Category：	wafer test program More
Application：	More
Data Type：	PCN/EOL More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	May 3,2022
Version Number：
Data Encoding：	PCN39-2022 -4LS
Data Size：	93 KB