PCN04A-2020–Test Location and Test Platform Change for CMV12000 Mono
Post time:2024-06-05 15:24:42
Poster:Innovo Technology
From:Network
●Dear Customer,
■Please be informed about the upcoming test location change to ams qualified subcontractor KYEC located In Taiwan and test platform change of ams CMV12000 product family.
●Change Description
■For the CMV12000 family, ams is currently using proprietary testers developed and built in house, ams will transfer both the wafer probing as well as the final electrical test for the concerned products to the Teradyne IP750EX ATE test platform. Both tests will be done at the qualified test subcontractor KYEC, whereas now wafer probing is done at ams and final electrical test is done at the assembly subcontractor.
●Traceability
■The ams ERP system assures the traceability by batch ID.
●Implementation Date and Schedule
■ams AG intends to release the transfer of the wafer probing as well as the final electrical test for the below products to the Teradyne IP750EX ATE test platform inQ1/2021.
ams AG | |
CMV12000HDR-2E5M1PA 、 CMV12000 More Part# | |
12Mp High Speed Machine Vision Global Shutter CMOS Image Sensor More | |
More | |
PCN/EOL More | |
More | |
Please see the document for details | |
More | |
More | |
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English Chinese Chinese and English Japanese | |
January 14, 2021 | |
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PCN04A-2020 | |
146 KB |