CN55-2020–Test Location and Test Platform Change release for CMV12000 Mono
Post time:2024-06-05 15:24:42
Poster:Innovo Technology
From:Network
●Dear Customer,
■As stated in PCN04-2020, ams AG intends to release the transfer of the wafer probing as well as the final electrical test for the below products to the Teradyne IP750EX ATE test platform.
■If you do have further questions, please do not hesitate to contact our customer support team at any time.
ams AG | |
CMV12000-2E5M1PN 、 CMV12000-2E5M1PA 、 CMV12000 More Part# | |
12Mp High Speed Machine Vision Global Shutter CMOS Image Sensor More | |
More | |
PCN/EOL More | |
More | |
Please see the document for details | |
More | |
More | |
| |
English Chinese Chinese and English Japanese | |
January 12, 2021 | |
| |
CN55-2020 | |
128 KB |