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CN55-2020–Test Location and Test Platform Change release for CMV12000 Mono

CN55-2020–Test Location and Test Platform Change release for CMV12000 Mono

Post time:2024-06-05 15:24:42

Poster:Innovo Technology

From:Network

●Dear Customer,
■As stated in PCN04-2020, ams AG intends to release the transfer of the wafer probing as well as the final electrical test for the below products to the Teradyne IP750EX ATE test platform.
■If you do have further questions, please do not hesitate to contact our customer support team at any time.

ams AG

CMV12000-2E5M1PN 、 CMV12000-2E5M1PA 、 CMV12000

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Part#

12Mp High Speed Machine Vision Global Shutter CMOS Image Sensor

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PCN/EOL

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Please see the document for details

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January 12, 2021

CN55-2020

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