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Discrete Wafer FAB Source and Assembly & Test Site PRODUCT CHANGE NOTICE (2560)

Discrete Wafer FAB Source and Assembly & Test Site PRODUCT CHANGE NOTICE (2560)

Post time:2024-06-05 15:50:18

Poster:Innovo Technology

From:Network

●DESCRIPTION OF CHANGE
■This PCN is being issued to notify customers that in order to assure continuity of supply, Diodes Incorporated has qualified anadditional internal wafer source located in Greenock, Scotland (GFAB) and an additional internal assembly and test site (SAT) in Shanghai, China for select products listed below.
■Full electrical characterization and high reliability testing has been completed on representative part numbers to ensure no change to device functionality or electrical specifications in the datasheet. Refer to the attached qualification report embedded in this file.
■There will be no change to the Form, Fit, or Function of affected products.

DIODES

SDM01U50CP3-7 、 SDM02L30CP3-7 、 SDM02M30DCP3-7 、 SDM02U30CSP-7 、 SDM05A30CP3-7 、 SDT20100CTB-13 、 SDT5A100SAF-13 、 SDT5H100SB-13 、 SDT5A100SB-13 、 SDM05U20CSP-7 、 SDM05U20S3-7 、 SDM05U40CSP-7 、 SDM1A30CSP-7 、 SDM1A40CP3-7 、 SDT60100CTB-13 、 SDM1A40CSP-7 、 SDM1L20DCP3-7 、 SDM1L30CSP-7 、 SDM1U20CSP-7 、 SDM1U30CP3-7 、 SDM1U40CSP-7 、 SDM2A20CSP-7 、 SDM2A40CSP-7B 、 SDM2U20CSP-7 、 SDM2U20SD3-7 、 SDM2U30CSP-7 、 SDM2U30CSP-7B 、 SDM2U40CSP-7B 、 SDM4A30EP3-7B 、 SDM4A40EP3-7B 、 SDM5U45EP3-7

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Part#

Wafer FAB Source

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PCN/EOL

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Please see the document for details

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16 December, 2021

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2560

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