Discrete Wafer FAB Source and Assembly & Test Site PRODUCT CHANGE NOTICE (2560)
Post time:2024-06-05 15:50:18
Poster:Innovo Technology
From:Network
●DESCRIPTION OF CHANGE
■This PCN is being issued to notify customers that in order to assure continuity of supply, Diodes Incorporated has qualified anadditional internal wafer source located in Greenock, Scotland (GFAB) and an additional internal assembly and test site (SAT) in Shanghai, China for select products listed below.
■Full electrical characterization and high reliability testing has been completed on representative part numbers to ensure no change to device functionality or electrical specifications in the datasheet. Refer to the attached qualification report embedded in this file.
■There will be no change to the Form, Fit, or Function of affected products.
DIODES | |
SDM01U50CP3-7 、 SDM02L30CP3-7 、 SDM02M30DCP3-7 、 SDM02U30CSP-7 、 SDM05A30CP3-7 、 SDT20100CTB-13 、 SDT5A100SAF-13 、 SDT5H100SB-13 、 SDT5A100SB-13 、 SDM05U20CSP-7 、 SDM05U20S3-7 、 SDM05U40CSP-7 、 SDM1A30CSP-7 、 SDM1A40CP3-7 、 SDT60100CTB-13 、 SDM1A40CSP-7 、 SDM1L20DCP3-7 、 SDM1L30CSP-7 、 SDM1U20CSP-7 、 SDM1U30CP3-7 、 SDM1U40CSP-7 、 SDM2A20CSP-7 、 SDM2A40CSP-7B 、 SDM2U20CSP-7 、 SDM2U20SD3-7 、 SDM2U30CSP-7 、 SDM2U30CSP-7B 、 SDM2U40CSP-7B 、 SDM4A30EP3-7B 、 SDM4A40EP3-7B 、 SDM5U45EP3-7 More Part# | |
Wafer FAB Source More | |
More | |
PCN/EOL More | |
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Please see the document for details | |
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English Chinese Chinese and English Japanese | |
16 December, 2021 | |
REV 1 | |
2560 | |
367 KB |