NAND Flash Die Change Notice (PCN22032201BUN)
Post time:2024-06-05 15:55:26
Poster:Innovo Technology
From:Network
●Detailed Description of Change:
■ATP hereby gives product change notification for Premium SD card 2GB cards.
■NAND Flash will be transitioned from 34nm SLC to 25nm SLC.
●Quality Impact: no
●Function Impact: minor
●Reliability Impact: minor
●Reason for Change:
■Due to supply constraint and consolidation of supply by our NAND flash supplier, ATP cannot provide any further support for the above product configurations with the longevity window previously planned.
■ATP will work with you to provide a transition window appropriate to re-qualify into other ATP configurations in this density for the extended future.
●Products Affected & Replacements:
■Current: AF2GSDI-BUN002
■New: AF2GSDI-SEK001
| ATP | |
| AF2GSDI-BUN002 、 AF2GSDI-SEK001 More Part# | |
| NAND Flash Die More | |
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More | |
| PCN/EOL More | |
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Please see the document for details | |
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More | |
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| English Chinese Chinese and English Japanese | |
| Mar. 22, 2022 | |
| Ver. 1.0 | |
| PCN22032201BUN;ATP-04-13-012B | |
| 331 KB |